Scanning electron microscope

New-generation Scanning Electron Microscope with field effect (SEM-FEG). Scanning electron microscopy produces high-resolution images of a sample by scanning its surface. Concarneau's SEM is a Zeiss Sigma 300 with an electronic source, FEG Schottky type (field emission gun), with the ultra high resolution Gemini® column, boosted to improve performance at low voltage, allowing analysis of samples at nanometric scale.

Category

Land-based tests and test sites for engineering and ocean observation
Analyses, measurements and metrology

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Scientific disciplines

Bioinformatics
Metrology
Marine Ecology

Strategic areas of action

Environmental and coastal planning and development
Marine biological resources
Shipbuilding and leisure boatbuilding

Examples of work

Nicolas Chomérat, Clémence Mahana iti Gatti, Élisabeth Nézan, and Mireille Chinain (2017) Studies on the benthic genus Sinophysis (Dinophysales, Dinophyceae) II. S. canaliculata from Rapa Island (French Polynesia). Phycologia: 2017, Vol. 56, No. 2, pp. 193-203.
Equipment
Modification date: 09/04/2025 01:17:24